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Proceedings of the 14th International Conference on Defects in Semiconductors :[held in] Paris, France, August 18-22, 1986

フォーマット:
図書
責任表示:
edited by H. J. von Berdeleben
言語:
英語
出版情報:
Aederlmannsdorf, Switzwelns : Trans Tech Publications, c1986
形態:
3 v. : ill. ; 25 cm
著者名:
シリーズ名:
Materials science forum ; v.10-12 <BA00294222>
書誌ID:
BA01066019
ISSN:
02555476  CiNii Articles  Webcat Plus  JAIRO
ISBN:
9780878495511 [0878495517] (pt.1 :)  CiNii Books  Webcat Plus  Google Books
9780878495511 [0878495517] (pt.2 :)  CiNii Books  Webcat Plus  Google Books
9780878495511 [0878495517] (pt.3 :)  CiNii Books  Webcat Plus  Google Books
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