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Electron fractography : a symposium presented at the 7th annual meeting, American Society for Testing and Materials, Boston, Mass., 25-30 June, 1967
- フォーマット:
- 図書
- 責任表示:
- American Society for Testing and Materials
- 言語:
- 英語
- 出版情報:
- Philadelphia : ASTM, c1968
- 形態:
- 230 p. ; 24 cm
- 著者名:
- American Society for Testing and Materials
- シリーズ名:
- ASTM special technical publication ; no. 436 <BA00068096>
- 書誌ID:
- BA07006406
類似資料:
American Society for Testing and Materials | |
American Society for Testing and Materials | |
U.M.I. (University Microfilms International) Out-of-Print Books on Demand | |
American Society for Testing and Materials | |
Published by the American Society for Testing Materials |