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Defects in silicon : proceedings of Symposium B on Science and Technology of Defects in Silicon of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989

フォーマット:
図書
責任表示:
edited by C.A.J. Ammerlaan, A. Chantre, P. Wagner
言語:
英語
出版情報:
Amsterdam ; New York : North-Holland, 1989
形態:
xii, 505 p. ; 27 cm
著者名:
シリーズ名:
European Materials Research Society symposia proceedings ; v. 9 <BA07004036>
書誌ID:
BA10898941
ISBN:
9780444886194 [0444886192]  CiNii Books  Webcat Plus  Google Books
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