XAFS V : proceedings of the 5th International Conference on X-ray Absorption Fine Structure, held in Seattle, WA,USA on August 21-26, 1988

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XAFS V : proceedings of the 5th International Conference on X-ray Absorption Fine Structure, held in Seattle, WA,USA on August 21-26, 1988

フォーマット:

図書

責任表示:

editors: Jose Mustre de León, Edward A. Stern, Dale E. Sayers, Yanjun Ma, John J. Rehr

言語:

英語

出版情報:

Amsterdam : North-Holland, 1989

形態:

xxvi, 732p. : ill. ; 27 cm

著者名:

書誌ID:

BB09185653

子書誌情報

所蔵情報

タイトル・著者・出版者が同じ資料

詳細

その他の標題:	XAFS
主題:	物理光学．波動光学
その他のタイトルのヨミ、その他のヨミ:	XAFS
TTLL:	eng

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