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Error analysis and calibration uncertainty of capacitance standards at NIST

フォーマット:
電子ブック
責任表示:
Chang, Y. May.
言語:
英語
出版情報:
Gaithersburg, MD
著者名:
Chang, Y. May.  
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Free, George M.

U.S. Dept. of Commerce, National Institute of Standards and Technology

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U.S. Dept. of Commerce, National Institute of Standards and Technology

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