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Error analysis and calibration uncertainty of capacitance standards at NIST
- フォーマット:
- 電子ブック
- 責任表示:
- Chang, Y. May.
- 言語:
- 英語
- 出版情報:
- Gaithersburg, MD
- 著者名:
- Chang, Y. May.
類似資料:
U.S. Dept. of Commerce, National Institute of Standards and Technology | |
U.S. Dept. of Commerce, National Institute of Standards and Technology | |
U.S. Department of Commerce, National Institute of Standards and Technology |
National Aeronautics and Space Administration, Langley Research Center |
U.S. Dept. of Commerce, National Institute of Standards and Technology |
U.S. Dept. of Commerce, National Institute of Standards and Technology |
U.S. Dept. of Commerce, National Institute of Standards and Technology | |
U.S. Dept. of Commerce, National Institute of Standards and Technology |