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Analysis of Scanning Errors Formed during Inspection of Printed Circuit Boards by Eddy-Current testing Probe

フォーマット:
論文
責任表示:
山田, 外史 ; 岩原, 正吉
言語:
英語
出版情報:
日本AEM学会 = The Japan Society of Applied Electromagnetics, 2001
著者名:
掲載情報:
Journal of the Japan Society of Applied Electromagnetics and Mechanics = 日本AEM学会誌
ISSN:
0919-4452  CiNii Research  Webcat Plus  JAIRO
巻:
9
通号:
1
開始ページ:
21
終了ページ:
26
バージョン:
publisher
概要:
This paper reports an analysis of errors formed during an inspection of printed circuit boards (PCB). A unique probe suitable for this inspection, has been fabricated. Although the probe has high sensitivity, there are some additional obsta cles, which have to be overcome - signals' separation and removal of not constant offset voltage from the output signal. In order to avoid misinterpretations of the signal obtained, the phase characteristic has been taken into account. The data from the phase characteristic are combined with the data coming from the amplitude characteristic. Thereby, information about defects, obtained from phase characteristic, can be confirmed with the information about defects delivered by the amplitude characteristic. Experimental results presented in this paper show good accuracy of this analysis method.<br />特集 第9回MAGDAコンファレンス 続きを見る
URL:
http://hdl.handle.net/2297/00048912
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