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High-density double-layer printed circuit board inspection by using high-frequency eddy-current probe

フォーマット:
論文
責任表示:
Chomsuwan, Komkrit ; Yamada, Satoshi ; Iwahara, Masayoshi
言語:
英語
出版情報:
金沢大学自然計測応用研究センター, 2005-12-01
著者名:
掲載情報:
金沢大学自然計測応用研究センター年報
開始ページ:
102
終了ページ:
103
概要:
岩原, 正吉
URL:
http://hdl.handle.net/2297/2353
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1 論文 Application of Eddy-Current Testing Technique for High-Density Double-Layer Printed circuit Board Inspection

Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi, Wakiwaka, H., Shoji, S.

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2 論文 Application of Eddy-current testing technique for high-density double-layer printed circuit board inspection

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8 論文 Bare PCB inspection system with SV-GMR sensor eddy-current testing probe

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3 図書 Inspection system of high-density printed circuit board based on eddy-current testing technique with spin-valve giant magnetoresistance sensor

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10 論文 Simulation of amplitude and phase characteristics during inspection of printed circuit board by eddy-current testing probe

Kacprzak, D., Yamada, Sotoshi, Iwahara, Masayoshi, 山田, 外史, 岩原, 正吉

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5 論文 Eddy-Current Testing Probe With Spin-Valve Type GMR Sensor for Printed Circuit Board Inspection

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