Eddy Current Testing Probe Composed of Planar Coils

Eddy Current Testing Probe Composed of Planar Coils

フォーマット:

論文

責任表示:

Yamada, Sotoshi ; Katou, M. ; Iwahara, Masayoshi ; Dawson, F.P.

言語:

英語

出版情報:

Institute of Electrical and Electronics Engineers IEEE, 1995-11-01

著者名:

掲載情報:

IEEE Transactions on Maggetics

ISSN:

0018-9464

巻:

31

通号:

6

開始ページ:

3185

終了ページ:

3187

バージョン:

publisher

概要:

This paper presents a new eddy-current probe composed of a micro-planar mesh coil and meander coil. The probe can be used to detect the existence and the size of cracks in metallic structures. Experimental results for the sensed output voltage of this device are presented. The output signal is shown to have a discrete nature. Also, the results show that the signal strength is weak and that an offset voltage exists. Improved probe characteristics are obtained by … connecting two mesh coils in series, stacking the coils on top of each other and orienting the two coils 180° apart. 続きを見る

URL:

http://hdl.handle.net/2297/48318

タイトル・著者・出版者が同じ資料

詳細

受理日:	1995-11-01

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1 論文 Defect Images by Planar ECT Probe of Meander-Mesh Coils Yamada, Sotoshi, Katou, M., Iwahara, Masayoshi, Dawson, F.P. Institute of Electrical and Electronics Engineers IEEE	7 論文 Conductive microbead array detection based on eddy-current testing using SV-GMR sensor and helmhlotz coil exciter Somsak, T., Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi Institute of Electrical and Electronics Engineers (IEEE)
2 論文 Defect images by planar ect probe of meader-mesh coils Yamada, Sotoshi, Katou, Masaki, Iwahara, Masayoshi, Dawson, Francis P. IEEE	8 論文 Introduction of a Base-Model for Eddy Current Testing of Printed Circuits Boards Bayani, H., Nishino, M., Yamada, Sotoshi, Iwahara, Masayoshi Institute of Electrical and Electronics Engineers IEEE
3 論文 Investigation of printed wiring board testing by using planar coil type ECT probe Yamada, Sotoshi, Fujiki, Hisashi, Iwahara, Masayoshi, Mukhopadhyay, S. C., Dawson, Francis P. IEEE	9 論文 Design Improvements to a Three-Material Passive Magnetic Current Limiter Calman, S., Dawson, F.P., Yamada, Sotoshi, Iwahara, Masayoshi Institute of Electrical and Electronics Engineers IEEE
4 論文 Superposition of Signal Components During Inspection of Printed Circuit Boards by an Eddy Current Testing Probe with a Solenoid Pick-up Coil Kacprzak, D., Taniguchi, T., Nakamura, N., Yamada, Sotoshi, Iwahara, Masayoshi Institute of Electrical and Electronics Engineers IEEE	10 論文 A comparison between a two-material and three-material magnetic current limiter Young, S., Dawson, F.P., Iwahara, Masayoshi, Yamada, Sotoshi AIP Publishing
5 論文 Bare PCB inspection system with SV-GMR sensor eddy-current testing probe Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi IEEE	11 論文 Eddy-Current Testing Probe With Spin-Valve Type GMR Sensor for Printed Circuit Board Inspection Yamada, Sotoshi, Chomsuwan, K., Fukuda, Y., Iwahara, Masayoshi, Wakiwaka, H., Shoji, S. Institute of Electrical and Electronics Engineers IEEE
6 論文 Conductive Microbead Array Detection Based on Eddy-Current Testing Using SV-GMR Sensor and Helmholtz Coil Exciter Somsak, T., Chomsuwnan, K., Yamada, Sotoshi, Iwahara, Masayoshi Institute of Electrical and Electronics Engineers IEEE	12 論文 Eddy-current testing probe with spin-valve type GMR sensor for printed circuit board inspection Yamada, Sotoshi, Chomsuwan, K., Fukuda, Y., Iwahara, Masayoshi, Wakiwaka, H., Shoji, S. IEEE