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Inspection of bare printed circuit board using planar type ect probe

フォーマット:
論文
責任表示:
Yamada, Sotoshi ; Iwahara, Masayoshi ; Fukuda, Y. ; Taniguchi, T. ; Wakiwaka, H.
言語:
英語
出版情報:
AIP Publishing, 2004-01-01
著者名:
掲載情報:
Review of Quantitative Nondestructive Evaluation
巻:
23
通号:
CP700
開始ページ:
374
終了ページ:
381
バージョン:
publisher
URL:
http://hdl.handle.net/2297/48633
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Institute of Electrical and Electronics Engineers IEEE

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Institute of Electrical and Electronics Engineers IEEE

Yamada, Sotoshi, Fujiki, H., Iwahara, Masayoshi, Mukhopadhyay, S.C., Dawson, F.P.

Institute of Electrical and Electronics Engineers IEEE

Chomsuwan, K., Fukuda, Y., Yamada, Sotoshi, Iwahara, Masayoshi, Wakiwaka, H., Shoji, S., 山田, 外史, 岩原, 正吉

The Japan Society of Applied Electromagnetics and Mechanics (JSAEM) = 日本AEM学会

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金沢大学自然計測応用研究センター