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Eddy-current testing probe with spin-valve type GMR sensor for printed circuit board inspection

フォーマット:
論文
責任表示:
Yamada, Sotoshi ; Chomsuwan, K. ; Fukuda, Y. ; Iwahara, Masayoshi ; Wakiwaka, H. ; Shoji, S.
言語:
英語
出版情報:
IEEE, 2004-07-01
著者名:
Yamada, Sotoshi
Chomsuwan, K.
Fukuda, Y.
Iwahara, Masayoshi
Wakiwaka, H.
Shoji, S.
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掲載情報:
IEEE Transactions on Magnetics
ISSN:
0018-9464  CiNii Research  Webcat Plus  JAIRO
巻:
40
通号:
4 II
開始ページ:
2676
終了ページ:
2678
バージョン:
publisher
概要:
金沢大学環日本海域環境研究センター生体機能計測研究部門<br />This paper proposes an eddy-current testing (ECT) probe composed of a spin-valve giant magnetoresistance (SV-GMR) sensor and a meander coil for the inspection of bare printed circuit board. The SV-GMR sensor serves as a magnetic sensor for the ECT probe to sense the variation of the magnetic field distribution occurred on the printed circuit board. The SV-GMR sensor is used specifically to detect the changing magnetic field distribution occurred at the defect point. The characteristics of the proposed probe are discussed in this paper. The comparisons of signal-to-noise ratios obtained from ECT probe with SV-GMR sensor and with solenoid coil verify that the applying of SV-GMR sensor to the ECT probe can improve the PCB inspection results. 続きを見る
URL:
http://hdl.handle.net/2297/6902
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Yamada, Sotoshi, Chomsuwan, K., Fukuda, Y., Iwahara, Masayoshi, Wakiwaka, H., Shoji, S.

Institute of Electrical and Electronics Engineers IEEE

Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi, Wakiwaka, H., Shoji, S.

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Institute of Electrical and Electronics Engineers IEEE

Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi

Institute of Electrical and Electronics Engineers IEEE

Chomsuwan, K., Fukuda, Y., Yamada, Sotoshi, Iwahara, Masayoshi, Wakiwaka, H., Shoji, S., 山田, 外史, 岩原, 正吉

The Japan Society of Applied Electromagnetics and Mechanics (JSAEM) = 日本AEM学会

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Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi, Wakiwaka, H., Shoji, S.

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金沢大学自然計測応用研究センター