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Improvement on defect detection performance of PCB inspection based on ECT technique with multi-SV-GMR sensor

フォーマット:
論文
責任表示:
Chomsuwan, K. ; Yamada, Sotoshi ; Iwahara, Masayoshi
言語:
英語
出版情報:
IEEE, 2007-06-01
著者名:
掲載情報:
IEEE Transactions on Magnetics
ISSN:
0018-9464  CiNii Research  Webcat Plus  JAIRO
巻:
43
通号:
6
開始ページ:
2394
終了ページ:
2396
バージョン:
publisher
概要:
金沢大学環日本海域環境研究センター生体機能計測研究部門<br />This paper describes the improvement on the defect detection performance of printed circuit board (PCB) inspection based on the eddy-current testing (ECT) technique with the multispin-valve giant magne toresistance (SV-GMR) sensor. To obtain the ECT signal in the same scanning line, SV-GMR sensors are mounted on the exciting coil in the same column parallel with the scanning direction. Harmonic analysis based on the Fourier transform is used to analyze the signal from the SV-GMR sensor in order to increase scanning speed. Then signal averaging is applied to the ECT signal in order to improve the signal-to-noise ratio. Experimental results are performed to verify the inspection performance. © 2007 IEEE. 続きを見る
URL:
http://hdl.handle.net/2297/6913
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Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi

Institute of Electrical and Electronics Engineers IEEE

山田, 外史, 岩原, 正吉

日本AEM学会 = The Japan Society of Applied Electromagnetics

Chomsuwan, K., Fukuda, Y., Yamada, Sotoshi, Iwahara, Masayoshi, Wakiwaka, H., Shoji, S., 山田, 外史, 岩原, 正吉

The Japan Society of Applied Electromagnetics and Mechanics (JSAEM) = 日本AEM学会

Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi

IEEE

Taniguchi, T., Kacprzak, D., Yamada, Sotoshi, Iwahara, Masayoshi

Institute of Electrical and Electronics Engineers IEEE

Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi, Wakiwaka, H., Shoji, S.

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Yamada, Sotoshi, Chomsuwan, Komkrit, Hagino, T., Tian, H., Iwahara, Masayoshi

金沢大学自然計測応用研究センター

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Yamada, Sotoshi, Chomsuwan, K., Fukuda, Y., Iwahara, Masayoshi, Wakiwaka, H., Shoji, S.

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