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Bare PCB inspection system with SV-GMR sensor eddy-current testing probe

フォーマット:
論文
責任表示:
Chomsuwan, K. ; Yamada, Sotoshi ; Iwahara, Masayoshi
言語:
英語
出版情報:
IEEE, 2007-05-01
著者名:
掲載情報:
IEEE Sensors Journal
巻:
7
通号:
5
開始ページ:
890
終了ページ:
895
バージョン:
publisher
概要:
金沢大学環日本海域環境研究センター生体機能計測研究部門<br />This paper describes bare printed circuit board (PCB) inspection based on eddy-current testing (ECT) technique with high scanning speed. A high-frequency ECT probe composed of a meander coil as an exci ting coil and the spin-valve giant magnetoresistance (SV-GMR) sensor was fabricated and is proposed. The ECT probe was designed based on crack inspection over flat surface, especially suitable for microdefect detection on high-density bare PCB. The ECT signal detected by the SV-GMR sensor was acquired by high-speed A/D converter for applying the signal processing based on digital technique. Harmonic analysis based on Fourier transform was used to analyze the ECT signal at fundamental frequency in order to increase inspection speed and this technique allowed the ECT probe to scan bare PCB, with high sampling frequency and with high-spatial resolution inspection. Experimental results verified the possibility and the performance of the proposed PCB inspection system based on ECT technique. © 2007 IEEE. 続きを見る
URL:
http://hdl.handle.net/2297/6914
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山田, 外史, 岩原, 正吉

日本AEM学会 = The Japan Society of Applied Electromagnetics

Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi, Wakiwaka, H., Shoji, S.

Institute of Electrical and Electronics Engineers IEEE

Somsak, T., Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi

Institute of Electrical and Electronics Engineers (IEEE)

Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi

Institute of Electrical and Electronics Engineers IEEE

Kacprzak, D., Yamada, Sotoshi, Iwahara, Masayoshi, 山田, 外史, 岩原, 正吉

The Japan Society of Applied Electromagnetics and Mechanics (JSAEM) = 日本AEM学会

Yamada, Sotoshi, Chomsuwan, K., Hagino, T., Tian, H., Minamide, K., Iwahara, Masayoshi

Institute of Electrical and Electronics Engineers IEEE

Yamada, Sotoshi, Chomsuwan, K., Fukuda, Y., Iwahara, Masayoshi, Wakiwaka, H., Shoji, S.

Institute of Electrical and Electronics Engineers IEEE

Yamada, Sotoshi, Chomsuwan, K., Hagino, T., Tian, H., Minamide, K., Iwahara, Masayoshi

IEEE

Yamada, Sotoshi, Chomsuwan, K., Fukuda, Y., Iwahara, Masayoshi, Wakiwaka, H., Shoji, S.

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Yamada, Sotoshi, Chomsuwan, Komkrit, Hagino, T., Tian, H., Iwahara, Masayoshi

金沢大学自然計測応用研究センター