1.

図書
図書
1. Practical residual stress measurement methods
edited by Gary S. Schajer, University of British Columbia, Vancouver, Canada
出版情報: Chichester, West Sussex, United Kingdom : John Wiley & Sons Inc., 2013
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2.

図書
図書
2. Non-Destructive Testing - Test Method For Residual Stress Analysis by X-Ray Diffraction
DIN-Normen
出版情報: Berlin : DIN Deutsches Institut für Normung E.V., Beuth Verlag GmbH, 2009
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3.

図書
図書
3. Introduction to contact mechanics. 2nd ed
Anthony C. Fischer-Cripps
出版情報: New York : Springer, c2007
シリーズ名: Mechanical engineering series
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4.

図書
図書
4. Two-dimensional X-ray diffraction
Bob B. He
出版情報: Hoboken, N.J. : Wiley, c2009
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5.

図書
図書
5. Optically stimulated luminescence : fundamentals and applications
Eduardo G. Yukihara and Stephen W.S. McKeever
出版情報: Chichester, West Sussex, UK : John Wiley & Sons, 2011
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6.

雑誌
雑誌
6. The technology teacher : a journal of the American Industrial Arts Association
出版情報: [Reston, Va.] : American Industrial Arts Association, 1983-2010
巻次(年次): Vol. 43, no. 1 (Sept./Oct. 1983)-v. 69, no. 8 (May/June 2010)
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7.

雑誌
雑誌
7. Economic survey of Japan
Economic Stabilization Board, Japanese Government
出版情報: Tokyo : [Printing Bureau, Ministry of Finance], -2000
巻次(年次): -1999/2000 (1999/2000)
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