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Defects in silicon : proceedings of Symposium B on Science and Technology of Defects in Silicon of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989
- フォーマット:
- 図書
- 責任表示:
- edited by C.A.J. Ammerlaan, A. Chantre, P. Wagner
- 言語:
- 英語
- 出版情報:
- Amsterdam ; New York : North-Holland, 1989
- 形態:
- xii, 505 p. ; 27 cm
- 著者名:
- シリーズ名:
- European Materials Research Society symposia proceedings ; v. 9 <BA07004036>
- 書誌ID:
- BA10898941
- ISBN:
- 9780444886194 [0444886192]
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Research Group of Ion Engineering in Ion Beam Engineering Experimental Laboratory, Kyoto University, Professional Group of Electron Devices, Institute of Electrical Engineers of Japan | |
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Research Institute of Electronics Shizuoka University | |