Novel Eddy Current Testing Sensor for the Inspection of Printed Circuit Boards

Novel Eddy Current Testing Sensor for the Inspection of Printed Circuit Boards

フォーマット:

論文

責任表示:

Kacprzak, D. ; Taniguchi, T. ; Nakamura, N. ; Yamada, Sotoshi ; Iwahara, Masayoshi

言語:

英語

出版情報:

Institute of Electrical and Electronics Engineers IEEE, 2001-07-01

著者名:

掲載情報:

IEEE Transactions on Maggetics

ISSN:

0018-9464

巻:

37

通号:

4

開始ページ:

2010

終了ページ:

2012

バージョン:

publisher

概要:

This paper presents a novel eddy-current testing (ECT) sensor for the inspection of printed circuit board (PCB), which detects trace damages on PCB conductors. The sensor is composed of a meander-exciting coil and three solenoid pick-up coils. Application of three pick-up coils increases the speed of the inspection process. Information about defects can be extracted either from an amplitude or a phase of a signal obtained during the inspection. A visualization process was … provided using the amplitude data. In this paper the structure of the ECT sensor and principles of detection as well as experimental results are presented. 続きを見る

URL:

http://hdl.handle.net/2297/48296

タイトル・著者・出版者が同じ資料

詳細

主題:	Defect; Meander coil; PCB; Sensor; Solenoid coil; Testing
受理日:	2001-07-01

類似資料:

1

2

3

4

5

6

7

8

9

10

11

12

1 論文 Superposition of Signal Components During Inspection of Printed Circuit Boards by an Eddy Current Testing Probe with a Solenoid Pick-up Coil Kacprzak, D., Taniguchi, T., Nakamura, N., Yamada, Sotoshi, Iwahara, Masayoshi Institute of Electrical and Electronics Engineers IEEE	7 論文 Eddy-Current Testing Probe With Spin-Valve Type GMR Sensor for Printed Circuit Board Inspection Yamada, Sotoshi, Chomsuwan, K., Fukuda, Y., Iwahara, Masayoshi, Wakiwaka, H., Shoji, S. Institute of Electrical and Electronics Engineers IEEE
2 論文 Introduction of a Base-Model for Eddy Current Testing of Printed Circuits Boards Bayani, H., Nishino, M., Yamada, Sotoshi, Iwahara, Masayoshi Institute of Electrical and Electronics Engineers IEEE	8 論文 Eddy-current testing probe with spin-valve type GMR sensor for printed circuit board inspection Yamada, Sotoshi, Chomsuwan, K., Fukuda, Y., Iwahara, Masayoshi, Wakiwaka, H., Shoji, S. IEEE
3 論文 Introduction of a Base-Model for Eddy Current Testing of Printed Circuit Boards Hossein, Bayani, Nishino, Masanobu, Yamada, Sotoshi, Iwahara, Masayoshi, 山田, 外史, 別所, 一夫日本AEM学会 = The Japan Society of Applied Electromagnetics and Mechanics	9 論文 Application of Eddy-Current Testing Technique for High-Density Double-Layer Printed circuit Board Inspection Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi, Wakiwaka, H., Shoji, S. Institute of Electrical and Electronics Engineers IEEE
4 論文 Application of ECT Technique for Inspection of Bare PCB Yamada, Sotoshi, Nakamura, Kazunori, Iwahara, Masayoshi, Taniguchi, T., Wakiwaka, H. Institute of Electrical and Electronics Engineers IEEE	10 論文 Application of Eddy-current testing technique for high-density double-layer printed circuit board inspection Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi, Wakiwaka, H., Shoji, S. IEEE
5 論文 Wavelet-Based Processing of ECT Images for Inspection of Printed Circuit Board Taniguchi, T., Kacprzak, D., Yamada, Sotoshi, Iwahara, Masayoshi Institute of Electrical and Electronics Engineers IEEE	11 論文 Bare PCB inspection system with SV-GMR sensor eddy-current testing probe Chomsuwan, K., Yamada, Sotoshi, Iwahara, Masayoshi IEEE
6 論文 Simulation of amplitude and phase characteristics during inspection of printed circuit board by eddy-current testing probe Kacprzak, D., Yamada, Sotoshi, Iwahara, Masayoshi, 山田, 外史, 岩原, 正吉 The Japan Society of Applied Electromagnetics and Mechanics (JSAEM) = 日本AEM学会	12 論文 Inspection of bare printed circuit board using planar type ect probe Yamada, Sotoshi, Iwahara, Masayoshi, Fukuda, Y., Taniguchi, T., Wakiwaka, H. AIP Publishing