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Sampling, wavelets, and tomography

フォーマット:
図書
責任表示:
John J. Benedetto, Ahmed I. Zayed, editors
言語:
英語
出版情報:
Boston : Birkhäuser, c2004
形態:
xxi, 344 p. : ill. ; 25 cm
著者名:
シリーズ名:
Applied and numerical harmonic analysis / series editor, John J. Benedetto <BA30247287>
書誌ID:
BA65445334
ISBN:
9780817643041 [0817643044]  CiNii Books  Webcat Plus  Google Books
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