Hugo J. Woerdeman

edited by Felix M. Gradstein ... [et al.]

Karl-Heinrich Grote, Hamid Hefazi, editors

edited by Pirjo Kääriäinen ... [et al.]

Jet Nestruev

edited by Richard O. Snyder, Philippe Moullier

John P. Nolan

edited by Howard S. Cohl, Mourad E.H. Ismail

Armen Gulian

Vadim Kaloshin, Ke Zhang

Ryo Sakurai

Jianxin Wu

倉品さやか著

James Goff, Walter Dudley

edited by Klemen Zupancic, Tea Pavlek, Jana Erjavec

Hans Lüth

David J. Blower

Ashish K. Srivastava, Askar Tuganbaev, Pedro A. Guil Asensio

Hans Fischer

Wei Qi Yani

Manuel F. Varela, Ann F. Varela and Michael F. Shaughnessy

edited by Gauri Misra, Jyotika Rajawat

edited by Tiago Miguel Ferreira

edited by Yoshikazu Giga ... [et al.]

Sergiu Klainerman, Jérémie Szeftel

William B. Claster

R.K. Pathria, Paul D. Beale

Vaidurya Pratap Sahi, František Baluška, editors

American Society for Testing and Materials

Richard Beals, Roderick S.C. Wong

Giovanni Catino, Paolo Mastrolia

von Herbert Louis

Maurice Heins

edited by Carl Eisdorfer and William E. Fann

Faith A. Morrison

edited by Sensuke Ogoshi

Joseph Rykwert ; traduit de l'anglais par Lucienne Lotringer ; avec la collaboration de Daniel Grisou et Monique Lulin

by Frederic A. Gibbs and Erna L. Gibbs

by Norman H. Crowhurst

Lowell W. Beineke, Martin Charles Golumbic, Robin J. Wilson

Rennie, Richard ; Daintith, John

Hal Tasaki

Sergios Theodoridis

preface by Hideto Fuse ; introduction by Robert J. Lang ; text by David Brill and Tomoko Fuse ; translated by Ornella Civardi and Irina Oryshkevich ; photography by Tsuyoshi Hongo, Kengo Endo

by Catrien Ross

Matheus C. Bortolan, Alexandre N. Carvalho, José A. Langa

Richard J. Roiger

Peter Bruce, Andrew Bruce, and Peter Gedeck

Nikolai M. Adrianov, Fedor Pakovich, Alexander K. Zvonkin