※一部利用できない機能があります
- Charge trapping (2)
- Oxides (2)
- Radio-frequency magnetron sputtering (2)
- Silicon dioxide (2)
- Al-rich aluminum oxide (1)
- Aluminum oxide (1)
- Capacitance-voltage measurements (1)
- Current-voltage hysteresis (1)
- Interface (1)
- Thermal annealing (1)